Description

NI  PXIE-5632  Microwave Vector Network Analysis Module

Frequency range: 1MHz to 26.5GHz, covering L-band to Ka-band, supporting high-precision measurement of microwave band components and systems.
Port configuration: Dual ports (Port1/Port2), supporting full matrix measurement of S parameters (S11, S12, S21, S22).
Dynamic range: >125dB (typical value), ensuring measurement accuracy in low reflection or high isolation scenarios.
Scanning speed: Up to 20μs per point (narrowband mode), suitable for the rapid frequency scanning requirements in mass production testing.

Wideband coverage and high-precision measurement
1MHz – 26.5GHz continuous sweep frequency: It can measure the transmission and reflection characteristics of devices such as antennas, filters, power amplifiers, and RF cables in the microwave frequency band, for example:
S11 (Reflection Coefficient) : Evaluate the antenna matching degree or the stopband suppression capability of the filter;
S21 (Transmission Coefficient) : Tests amplifier gain or cable insertion loss.
Low system error calibration: Supports calibration methods such as SOLT (short circuit – Open circuit – load – direct pass) and TRL (transmission – reflection – line). Combined with NI calibration components, the amplitude error can be controlled within ±0.05dB.

Dual-port S-parameter full matrix measurement
Simultaneously measure 4 S parameters: Through a dual-port design, reflection and transmission parameters can be obtained synchronously, avoiding multiple measurement errors of single-port devices, for example:
For two-port networks (such as filters), a complete S-parameter matrix can be obtained in one scan, improving the test efficiency.
Phase measurement accuracy: Phase stability <0.01°/℃, suitable for differential signal integrity analysis of high-speed digital interfaces (such as PCIe 4.0).

PXI Express Bus and Modular Expansion
High-speed data transmission: Achieve a maximum bandwidth of 8GB/s through the PXIe Gen3 interface and support real-time upload of massive measurement data (such as 100,000 point frequency sweep data).
Multi-module synchronization capability: It can achieve sub-nanosecond clock synchronization with other PXIE modules (such as signal sources and oscilloscopes) through NI’s SystemLink synchronization bus, and build complex RF test systems (such as joint testing of transceivers).

Flexible scanning and triggering modes
Multi-dimensional scanning function
Frequency scanning: Linear/logarithmic stepping, supporting narrowband (CW) or wideband frequency scanning;
Power scanning: Output power range from -130 DBM to +10dBm, test the power response characteristics of the device (such as the compression point of the amplifier);
Time-domain scanning: Convert frequency-domain data into time-domain through inverse Fourier transform to locate impedance discontinuity points (such as cable break points).

Trigger and sequence control: Supports external triggers (such as changes in the status of the device under test), software triggers, or automatic calibration triggers based on scanning points, adapting to automated testing processes.